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Kathryn Dooley, research scientist, National Gallery of Art, Washington, DC, presents several case studies exemplifying the use of reflectance imaging spectroscopy and imaging x-ray fluorescence spectroscopy to the study of paintings and works on paper. Dooley spoke at a one-day symposium held at the National Gallery of Art on September 21, 2015, which was supported by The Andrew W. Mellon Foundation.

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